Speaker
Description
A SCRIT (Self-confining RI Ion target) technique forms an ion target in an electron storage ring for electron-RI scattering experiments. The target ions are trapped transversely by periodic focusing forces of electron beam bunches and longitudinally by an electrostatic well potential produced by the SCRIT device. The trapped target ions are focused onto the electron beam axis as their charge state increases by electron impact ionizations, and their density changes dynamically during the ion trapping. Although the current target ion density is approximately 10⁹ ions/cm², only 10–20% of the injected target ions to the SCRIT device contribute to electron scattering. This indicates a potential for increasing the target density by a factor of 5 to 10.
A previous study using ion-trapping simulations in the SCRIT device suggested that the time evolution of the target density strongly depends on the charge-state distribution of trapped ions and the stability of the electron beam. In this study, we evaluated the time evolution of target densities and charge-state distributions of trapped $^{132}$Xe ions using electron beams with different stabilities. Under the lower electron beam stability, the target density decreased to one-tenth of its initial value within approximately 450 ms. In contrast, the target density remained nearly constant for about 1 second under the higher electron beam stability. This presentation details the measurements and discusses the results.
| Email address | ryo.ogawara@riken.jp |
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| Funding Agency | This work was supported by JSPS KAKENHI Grant Number JP24004788 and JP23725901. |
| Classification | Ion traps and laser techniques |
